The first time for domestically produced memory! Changxin DDR5 new product

Kuai Technology reported on August 16 that SINKER, a sub-brand of Jiahe Jinwei, officially launched DDR5 RDIMM 48GB 5600MT/s server-specific memory equipped with domestic Changxin particles. This is also the first known domestic particle server memory with 48GB non-binary capacity. Starting from May 2026, Shenke server memory has been fully introduced into Changxin DDR5 particles, and DDR5-5600 RDIMM products with 64GB, 32GB, and 16GB capacities have been launched successively, with frequencies of 5600MT/s. The newly added 48GB specification is equipped with domestic DRAM wafers for independent packaging. From the wafer storage stage, electrical parameter scanning, leakage characteristic detection, impedance consistency verification and process defect screening are performed one by one to control the electrical parameter deviation of a single chip within the minimum threshold allowed by the industry. This memory adopts 2Rank×8 (2R8) standard DRAM bit width arrangement and is specially designed for high-density server expansion scenarios. After optimizing the electrical load, single- or dual-channel servers can achieve TB-level total memory capacity deployment, providing sufficient physical space for large memory demand scenarios such as virtual machine clusters, in-memory databases, and AI large model loading. Its operating rate reaches 5600MT/s, which is equivalent to PC5-44800, and the single bandwidth exceeds 44.8GB/s. Compared with the DDR4 architecture, the bandwidth is doubled, and the processing efficiency of data-intensive tasks such as AI model training and big data analysis is significantly improved. The 1.1V standard low-voltage power supply combined with the onboard PMIC power management chip intelligent voltage regulation and consumption control can release high performance while taking into account energy efficiency optimization, helping data centers reduce PUE values. The memory is also equipped with a dual error correction architecture consisting of On-die ECC (on-die error correction) and External ECC (external error correction), which can automatically detect and repair single-bit or even multi-bit data errors. In the special verification test, single/multi-bit data error scenarios were manually simulated, and the detection, repair and alarm functions of the dual ECC architecture were effectively verified. The official environmental test session implements a wide temperature range of 45℃ to 85℃ 7×24